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1

[IEEE 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - New Orleans, LA, USA (2020.3.15-2020.3.19)] 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - Virtual Impedance Shaping for low voltage Microgrids

Patel, Sourav, Chakraborty, Soham, Roychowdhury, Subhrajit, Salapaka, Murti V.

Year:

2020

File:

PDF, 3.41 MB

2020

2

Model Development for Atomic Force Microscope Stage Mechanisms

Smith, Ralph C., Hatch, Andrew G., De, Tathagata, Salapaka, Murti V., del Rosario, Ricardo C. H., Raye, Julie K.

Journal:

SIAM Journal on Applied Mathematics

Year:

2006

Language:

english

File:

PDF, 436 KB

english, 2006

3

On the Problem of Reconstructing an Unknown Topology via Locality Properties of the Wiener Filter

Materassi, Donatello, Salapaka, Murti V.

Journal:

IEEE Transactions on Automatic Control

Year:

2012

Language:

english

File:

PDF, 470 KB

english, 2012

4

Model Development for Atomic Force Microscope Stage Mechanisms

Ralph C. Smith, Andrew G. Hatch, Tathagata De, Murti V. Salapaka, Ricardo C. H. Del Rosario and Julie K. Raye

Journal:

SIAM Journal on Applied Mathematics

Year:

2006

Language:

english

File:

PDF, 1.98 MB

english, 2006

5

Architectures for Distributed Controller With Sub-Controller Communication Uncertainty

Yadav, Vikas, Salapaka, Murti V., Voulgaris, Petros G.

Journal:

IEEE Transactions on Automatic Control

Year:

2010

Language:

english

File:

PDF, 749 KB

english, 2010

6

Scanning Probe Microscopy

SALAPAKA, SRINIVASA, SALAPAKA, MURTI

Journal:

IEEE Control Systems Magazine

Year:

2008

Language:

english

File:

PDF, 2.65 MB

english, 2008

7

A Generalized Zames-Falb Multiplier

Materassi, Donatello, Salapaka, Murti V.

Journal:

IEEE Transactions on Automatic Control

Year:

2011

Language:

english

File:

PDF, 232 KB

english, 2011

8

Model detection with application to probe based data storage

Ghosal, Sayan, Saraswat, Govind, Salapaka, Murti

Journal:

Year:

2016

Language:

english

File:

PDF, 2.69 MB

english, 2016

9

[IEEE 2016 American Control Conference (ACC) - Boston, MA, USA (2016.7.6-2016.7.8)] 2016 American Control Conference (ACC) - Graphoid-based methodologies in modeling, analysis, identification and control of networks of dynamic systems

Materassi, Donatello, Salapaka, Murti V.

Year:

2016

Language:

english

File:

PDF, 384 KB

english, 2016

10

Memory erasure using time-multiplexed potentials

Talukdar, Saurav, Bhaban, Shreyas, Salapaka, Murti V.

Journal:

Physical Review E

Year:

2017

Language:

english

File:

PDF, 480 KB

english, 2017

11

[IEEE 2017 IEEE 56th Annual Conference on Decision and Control (CDC) - Melbourne, Australia (2017.12.12-2017.12.15)] 2017 IEEE 56th Annual Conference on Decision and Control (CDC) - Network topology identification from corrupt data streams

Subramanian, Venkat Ram, Lamperski, Andrew, Salapaka, Murti V.

Year:

2017

Language:

english

File:

PDF, 148 KB

english, 2017

12

[IEEE 2019 American Control Conference (ACC) - Philadelphia, PA, USA (2019.7.10-2019.7.12)] 2019 American Control Conference (ACC) - Exact Topology Learning in a Network of Cyclostationary Processes

Doddi, Harish, Talukdar, Saurav, Deka, Deepjyoti, Salapaka, Murti

Year:

2019

Language:

english

File:

PDF, 396 KB

english, 2019

13

Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscope

Tathagata De, Antony M. Chettoor, Pranav Agarwal, Murti V. Salapaka, Saju Nettikadan

Journal:

Ultramicroscopy

Year:

2010

Language:

english

File:

PDF, 349 KB

english, 2010

14

SISO controller design to minimize a positive combination of the l1 and the H2 norms

Murti V. Salapaka, Petros Voulgaris, Mohammed Dahleh

Journal:

Year:

1997

Language:

english

File:

PDF, 610 KB

english, 1997

15

Harnessing the transient signals in atomic force microscopy

Deepak R. Sahoo, Abu Sebastian, Murti V. Salapaka

Journal:

International Journal of Robust and Nonlinear Control

Year:

2005

Language:

english

File:

PDF, 633 KB

english, 2005

16

Hysteresis models of dynamic mode atomic force microscopes: analysis and identification via harmonic balance

Michele Basso, Donatello Materassi, Murti Salapaka

Journal:

Nonlinear Dynamics

Year:

2008

Language:

english

File:

PDF, 475 KB

english, 2008

17

Detection of Steps in Single Molecule Data

Tanuj Aggarwal, Donatello Materassi, Robert Davison, Thomas Hays, Murti Salapaka

Journal:

Cellular and Molecular Bioengineering

Year:

2012

Language:

english

File:

PDF, 1.18 MB

english, 2012

18

Solution of MIMO $\boldmath\mbox$\mathcalH_2/\ell_1$$ Problem Without Zero Interpolation

Salapaka, Murti V., Khammash, M., Dahleh, M.

Journal:

SIAM Journal on Control and Optimization

Year:

1999

Language:

english

File:

PDF, 299 KB

english, 1999

19

Mixed Objective Control Synthesis: Optimal $\ell_ 1/{\cal H}_2$ Control

Salapaka, Murti V., Dahleh, Mohammed, Voulgaris, Petros

Journal:

SIAM Journal on Control and Optimization

Year:

1997

Language:

english

File:

PDF, 825 KB

english, 1997

20

Controllability of molecular systems

Ramakrishna, Viswanath, Salapaka, Murti V., Dahleh, Mohammed, Rabitz, Herschel, Peirce, Anthony

Journal:

Physical Review A

Year:

1995

Language:

english

File:

PDF, 295 KB

english, 1995

21

SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, CA (Sunday 26 August 2007)] Optical Trapping and Optical Micromanipulation IV - Micro-manipulation using combined optical tweezers and atomic force microscope

Sehgal, Hullas, De, Tathagata, Nettikadan, Saju, Salapaka, Murti V., Dholakia, Kishan, Spalding, Gabriel C.

Year:

2007

Language:

english

File:

PDF, 855 KB

english, 2007

22

[IEEE 2008 IEEE International Symposium on Intelligent Control (ISIC) part of the Multi-Conference on Systems and Control - San Antonio, TX, USA (2008.09.3-2008.09.5)] 2008 IEEE International Symposium on Intelligent Control - Dynamic Mode, Probe Based High Density Data Storage: A collaborative effort with IBM, Zurich Research Labs

Salapaka, Murti V.

Year:

2008

Language:

english

File:

PDF, 173 KB

english, 2008

23

A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy

Sebastian, Abu, Gannepalli, Anil, Salapaka, Murti V.

Journal:

IEEE Transactions on Control Systems Technology

Year:

2007

Language:

english

File:

PDF, 873 KB

english, 2007

24

[IEEE 2013 American Control Conference (ACC) - Washington, DC (2013.6.17-2013.6.19)] 2013 American Control Conference - Design of a constant force clamp and estimation of molecular motor motion using modern control approach

Roychowdhury, Subhrajit, Bhaban, Shreyas, Salapaka, Srinivasa, Salapaka, Murti

Year:

2013

Language:

english

File:

PDF, 1.89 MB

english, 2013

25

[IEEE 2009 American Control Conference - St. Louis, MO, USA (2009.06.10-2009.06.12)] 2009 American Control Conference - Less conservative absolute stability criteria using Integral Quadratic Constraints

Materassi, Donatello, Salapaka, Murti V.

Year:

2009

Language:

english

File:

PDF, 624 KB

english, 2009

26

AFM Imaging?Reliable or Not?: Validation and Verification of Images in Atomic Force Microscopy

Salapaka, Srinivasa M., Ramamoorthy, Aditya, Salapaka, Murti V.

Journal:

IEEE Control Systems

Year:

2013

Language:

english

File:

PDF, 5.17 MB

english, 2013

27

Error Analysis for ML Sequence Detection in ISI Channels With Gauss Markov Noise

Kumar, Naveen, Ramamoorthy, Aditya, Salapaka, Murti V.

Journal:

IEEE Transactions on Signal Processing

Year:

2013

Language:

english

File:

PDF, 1.52 MB

english, 2013

28

Real time reduction of probe-loss using switching gain controller for high speed atomic force microscopy

Agarwal, Pranav, De, Tathagata, Salapaka, Murti V.

Journal:

Review of Scientific Instruments

Year:

2009

Language:

english

File:

PDF, 698 KB

english, 2009

29

Erratum: “Real time estimation of equivalent cantilever parameters in tapping mode atomic force microscopy” [Appl. Phys. Lett. 95, 083113 (2009)]

Agarwal, Pranav, Salapaka, Murti V.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 273 KB

english, 2012

30

Real-time detection of probe loss in atomic force microscopy

De, Tathagata, Agarwal, Pranav, Sahoo, Deepak R., Salapaka, Murti V.

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 597 KB

english, 2006

31

On contribution and detection of higher eigenmodes during dynamic atomic force microscopy

Saraswat, Govind, Salapaka, Murti V.

Journal:

Applied Physics Letters

Year:

2013

Language:

english

File:

PDF, 1.18 MB

english, 2013

32

[IEEE 2013 American Control Conference (ACC) - Washington, DC (2013.6.17-2013.6.19)] 2013 American Control Conference - Reconstruction of directed acyclic networks of dynamical systems

Materassi, Donatello, Salapaka, Murti V.

Year:

2013

Language:

english

File:

PDF, 263 KB

english, 2013

33

[IEEE 44th IEEE Conference on Decision and Control - Seville, Spain (12-15 Dec. 2005)] Proceedings of the 44th IEEE Conference on Decision and Control - Observer based imaging methods for Atomic Force Microscopy

Sahoo, D.R., De Murti, T., Salapaka, V.

Year:

2005

Language:

english

File:

PDF, 567 KB

english, 2005

34

High bandwidth force estimation for optical tweezers

Sehgal, Hullas, Aggarwal, Tanuj, Salapaka, Murti V.

Journal:

Applied Physics Letters

Year:

2009

Language:

english

File:

PDF, 485 KB

english, 2009

35

[IEEE GLOBECOM 2010 - 2010 IEEE Global Communications Conference - Miami, FL, USA (2010.12.6-2010.12.10)] 2010 IEEE Global Telecommunications Conference GLOBECOM 2010 - Performance Evaluation for ML Sequence Detection in ISI Channels with Gauss Markov Noise

Kumar, Naveen, Ramamoorthy, Aditya, Salapaka, Murti

Year:

2010

Language:

english

File:

PDF, 198 KB

english, 2010

36

[IEEE 2008 47th IEEE Conference on Decision and Control - Cancun, Mexico (2008.12.9-2008.12.11)] 2008 47th IEEE Conference on Decision and Control - Modeling and identification of the dynamics of electrostatically actuated microcantilever with integrated thermal sensor

Agarwal, Pranav, Sahoo, Deepak, Sebastian, Abu, Pozidis, Haris, Salapaka, Murti V.

Year:

2008

Language:

english

File:

PDF, 1.03 MB

english, 2008

37

High bandwidth optical force clamp for investigation of molecular motor motion

Roychowdhury, Subhrajit, Aggarwal, Tanuj, Salapaka, Srinivasa, Salapaka, Murti V.

Journal:

Applied Physics Letters

Year:

2013

Language:

english

File:

PDF, 1.39 MB

english, 2013

38

[IEEE 2013 American Control Conference (ACC) - Washington, DC (2013.6.17-2013.6.19)] 2013 American Control Conference - Topography detection using innovations mismatch method for high speed and high density dynamic mode AFM

Ghosal, Sayan, Saraswat, Govind, Ramamoorthy, Aditya, Salapaka, Murti

Year:

2013

Language:

english

File:

PDF, 521 KB

english, 2013

39

[IEEE 2012 IEEE 51st Annual Conference on Decision and Control (CDC) - Maui, HI, USA (2012.12.10-2012.12.13)] 2012 IEEE 51st IEEE Conference on Decision and Control (CDC) - Modeling and role of feedback controlled stochastic ratchets in cellular transport

Salapaka, Srinivasa, Rowchowdhury, Subhrajit, Salapaka, Murti

Year:

2012

Language:

english

File:

PDF, 982 KB

english, 2012

40

Real time estimation of equivalent cantilever parameters in tapping mode atomic force microscopy

Agarwal, Pranav, Salapaka, Murti V.

Journal:

Applied Physics Letters

Year:

2009

Language:

english

File:

PDF, 2.18 MB

english, 2009

41

[IEEE 2008 42nd Annual Conference on Information Sciences and Systems (CISS) - Princeton, NJ, USA (2008.03.19-2008.03.21)] 2008 42nd Annual Conference on Information Sciences and Systems - Channel modeling and detector design for dynamic mode high density probe storage

Kumar, Naveen, Agarwal, Pranav, Ramamoorthy, Aditya, Salapaka, Murti V.

Year:

2008

Language:

english

File:

PDF, 600 KB

english, 2008

42

Robust control approach to force estimation in a constant position optical tweezers

Aggarwal, Tanuj, Sehgal, Hullas, Salapaka, Murti

Journal:

Review of Scientific Instruments

Year:

2011

Language:

english

File:

PDF, 1012 KB

english, 2011

43

Transient-signal-based sample-detection in atomic force microscopy

Sahoo, Deepak R., Sebastian, Abu, Salapaka, Murti V.

Journal:

Applied Physics Letters

Year:

2003

Language:

english

File:

PDF, 370 KB

english, 2003

44

[IEEE 2009 American Control Conference - St. Louis, MO, USA (2009.06.10-2009.06.12)] 2009 American Control Conference - Attraction domain estimates combining lyapunov functions

Materassi, Donatello, Salapaka, Murti V.

Year:

2009

Language:

english

File:

PDF, 605 KB

english, 2009

45

Real-time nonlinear correction of back-focal-plane detection in optical tweezers

Aggarwal, Tanuj, Salapaka, Murti

Journal:

Review of Scientific Instruments

Year:

2010

Language:

english

File:

PDF, 876 KB

english, 2010

46

[IEEE 2007 American Control Conference - New York, NY, USA (2007.07.9-2007.07.13)] 2007 American Control Conference - Characterization of Dual Beam Optical Tweezers System Using a Novel Detection Approach

Sehgal, Hullas, Aggarwal, Tanuj, Salapaka, Murti

Year:

2007

Language:

english

File:

PDF, 240 KB

english, 2007

47

[IEEE 2011 American Control Conference - San Francisco, CA (2011.6.29-2011.7.1)] Proceedings of the 2011 American Control Conference - A generalized Zames-Falb multiplier

Materassi, Donatello, Salapaka, Murti V.

Year:

2011

Language:

english

File:

PDF, 180 KB

english, 2011

48

[IEEE 2013 IEEE International Conference on Control Applications (CCA) - Hyderabad, India (2013.08.28-2013.08.30)] 2013 IEEE International Conference on Control Applications (CCA) - Dynamic programming based approach for optimal transport by flashing ratchet against a load force

Roychowdhury, Subhrajit, Saraswat, Govind, Salapaka, Murti V.

Year:

2013

Language:

english

File:

PDF, 316 KB

english, 2013

49

[IEEE 2011 American Control Conference - San Francisco, CA (2011.6.29-2011.7.1)] Proceedings of the 2011 American Control Conference - Causal and non-causal filtering for network reconstruction

Materassi, Donatello, Salapaka, Murti V.

Year:

2011

Language:

english

File:

PDF, 191 KB

english, 2011

50

[IEEE 2010 44th Asilomar Conference on Signals, Systems and Computers - Pacific Grove, CA, USA (2010.11.7-2010.11.10)] 2010 Conference Record of the Forty Fourth Asilomar Conference on Signals, Systems and Computers - High-speed nano-imaging using dynamic mode AFM: A MAP detection approach

Kumar, Naveen, Saraswat, Govind, Agarwal, Pranav, Ramamoorthy, Aditya, Salapaka, Murti

Year:

2010

Language:

english

File:

PDF, 521 KB

english, 2010

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